Testing Method: SET2DIL

SET2DIL is a method of measuring Differential Insertion Loss (SDD21) using a single-ended TDR or VNA measurement, lending the name Single Ended Transmission 2 Differential Insertion Loss. It was created by Jeff Loyer and Richard Kunze in the late 2000s.

The single-ended solution was an departure from other loss testing methods that required 4 measurement ports and therefore 4 test points to be probed while measuring SDD21. This promised a simpler solution that could be utilized by manufacturers to ensure their manufacturing process was within the tolerances of attenuation as set by the circuit board designer.

For more information on the SET2DIL method, please see the original presentation delivered at DesignCon 2010.
(Loyer and Kunze, 2010)
http://magazines007.com/pdf/DC10_Loyer_Kunze.pdf

ACCU-Prober with SET2DIL

Introbotix was approached in 2010 by Intel Corporation to develop a commercially viable production product for measuring SET2DIL. Utilizing the ACCU-Prober platform, Introbotix released the ACCU-Prober with SET2DIL in April 2011. The ACCU-Prober for SET2DIL delivers measurements at 20GHz with results exported in the industry-standard comma delimited text format.  It is widely used by printed wiring board manufacturers worldwide.

ACCU-Prober with SET2DIL in Action

ACCU-Prober HF30 with SET2DIL

Responding to the industry need for testing at ever increasing frequencies, the ACCU-Prober HF30 was released in late 2013. This higher frequency configuration utilizes the same method, software, and production-friendly hand probe as the original but with measurements up to 30 GHz.

Introducing ACCU-Prober HF30 for SET2DIL