The CI1000 Robotic Controlled Impedance Tester
• IPC TM-650 220.127.116.11 (IPC-2141)
• Intel (Rambus) PCB Test Methodology
• IEC 326-3 (IEC 61188) Controlled Impedance
Run-Test capability is used for quick and simple runs. The tester delivers numerical impedance results.
Run and Config capability
enables a standard or custom test specification with guided steps or imported CAD/CAM file. Propagation Delay and TDR waveform data collection can be selected. Test coupons (pre-routed or in- panel), panels, or individual boards can all be accommodated.
are provided by the simultaneous generation of coupled TDR pulses. This simple, very effective technique provides true differential measurement. The probe calibration procedure eliminates probe-induced errors.
accuracy is ensured by taking up to eight (8) measurements per test point. Automatic fault detection eliminates false data production. Measurement automation ensures a very repeatable measurement process.
Intranet Network Support
provides access to the test database, all reports and results and the WaveView viewer. CAD/CAM data can be downloaded to the CI1000™ to set up the computer guidance screen and set all test parameters. Report Writer and WaveView screens can be viewed and sent through your network.
CI1000 Test Results
All test results are stored in a relational database for local or remote access. The test results can be correlated by: Time of tests, Test operator, Location of tests, Customer, In-process or final, Serial number, Test facility, Job or work order and TDR Waveform Viewer™
CI1000 Test Suites
Single-ended and Differential Measurements for: Mean/Min/Max Impedance, Propagation Delay & Velocity, Effective Dielectric Constant (Er), Interconnect Loss (Equivalent Bandwidth -3db), and TDR Waveforms.